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Vreeland, Thad
- Bai, G. and Tsai, C.-J., el al. (1987) Characterization of Semiconductors by MeV He+ Backscattering Spectrometry, Channeling and Double Crystal Diffraction
- Wie, C. R. and Vreeland, T., Jr., el al. (1985) MeV Ion Damage in III-V Semiconductors: Saturation and Thermal Annealing of Strain in GaAs and GaP Crystals
- Wie, C. R. and Vreeland, T., Jr., el al. (1984) Ion Beam Damage in CaF_2
- Vreeland, Thad, Jr. and Lau, Silvanus S. (1974) A study of dislocation mobility and density in metallic crystals
- Vreeland, T., Jr. and Jassby, K. M. (1972) Dislocation Interactions with Thermal Phonons and Conduction Electrons
- Vreeland, T., Jr. and Jassby, K. M. (1972) Comments on the Measurement of Dislocation Mobility and the Drag Due to Phonons and Electrons
- Nagata, Norio and Vreeland, T., Jr. (1970) Mobility of Basal Dislocations Interacting with Non Basal Dislocations in Zinc; 10.2172/4114816
- Pope, D. P. and Vreeland, T., Jr. (1969) Mobility of Basal Dislocations in Zinc
- Jassby, K. M. and Vreeland, T., Jr. (1969) The Mobility of Edge Dislocations in Pure Copper Single Crystals
- Jassby, K. M. and Vreeland, T., Jr. (1969) On the Damping of Screw Dislocation Motion in FCC Crystals by Phonon Viscosity
- Vreeland, T., Jr. (1967) Dislocation Velocity Measurements in Copper and Zinc
- Blish, R. C., II and Vreeland, T., Jr. (1967) Dislocation Velocity on the {1212}〈1213〉Slip System of Zinc
- Pope, D. P. and Vreeland, T., Jr., el al. (1967) A Comparison System for Microscope Images
- Adams, K. H. and Blish, R. C., el al. (1966) Second Order Pyramidal Slip in Zinc
- Adams, K. H. and Vreeland, T., Jr. (1963) Crystallographic Dependence of a Dislocation Etch for Zinc Single Crystals
- Moon, D. W. and Vreeland, T., Jr. (1963) Dislocation Velocity in Single and Polycrystalline Silicon Iron
- Vreeland, T., Jr. and Wood, D. S. (1954) A Comparison Between Dislocation Theory and Experimental Measurements of Delayed Yield in Steel
- Vreeland, T., Jr. and Wood, D. S., el al. (1952) A study of the mechanism of the delayed yield phenomenon
