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Royea, William Joseph
- Anz, Samir J. and Fajardo, Arnel M., el al. (2012) Semiconductor photoelectrochemistry; ISBN 978-1-1181-1074-4; Characterization of Materials; 864-898; 10.1002/0471266965.com052.pub2
- Royea, William J. and Hamann, Thomas W., el al. (2006) A Comparison between Interfacial Electron-Transfer Rate Constants at Metallic and Graphite Electrodes; Journal of Physical Chemistry B; Vol. 110; No. 39; 19433-19442; 10.1021/jp062141e
- Anz, Samir J. and Fajardo, Arnel M., el al. (2002) Semiconductor Photoelectrochemistry; ISBN 9780471268826; Characterization of Materials; 10.1002/0471266965.com052.pub2
- Gstrein, Florian and Michalak, David J., el al. (2002) Effects of Interfacial Energetics on the Effective Surface Recombination Velocity of Si/Liquid Contacts; Journal of Physical Chemistry B; Vol. 106; No. 11; 2950-2961; 10.1021/jp012997d
- Royea, William J. and Juang, Agnes, el al. (2000) Preparation of air-stable, low recombination velocity Si(111) surfaces through alkyl termination; Applied Physics Letters; Vol. 77; No. 13; 1988-1990; 10.1063/1.1312203
