Hamill, Gregory P.

Combined from CaltechAUTHORS

• Hamill, G. P. and Vreeland, T., Jr. (1979) Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography; Journal of Applied Crystallography; Vol. 12; No. 4; 346-350; 10.1107/S0021889879012668
• Hamill, G. P. and Vreeland, T., Jr. (1978) Silicon strain gages for cryostatic temperature use; Materials Science and Engineering; Vol. 32; No. 1; 99; 10.1016/0025-5416(78)90216-1