Vreeland, Thad

Monograph from CaltechAUTHORS

• Bai, G. and Tsai, C.-J., el al. (1987) Characterization of Semiconductors by MeV He+ Backscattering Spectrometry, Channeling and Double Crystal Diffraction
• Wie, C. R. and Vreeland, T., Jr., el al. (1985) MeV Ion Damage in III-V Semiconductors: Saturation and Thermal Annealing of Strain in GaAs and GaP Crystals
• Wie, C. R. and Vreeland, T., Jr., el al. (1984) Ion Beam Damage in CaF_2
• Vreeland, Thad, Jr. and Lau, Silvanus S. (1974) A study of dislocation mobility and density in metallic crystals
• Vreeland, T., Jr. and Jassby, K. M. (1972) Comments on the Measurement of Dislocation Mobility and the Drag Due to Phonons and Electrons
• Vreeland, T., Jr. and Jassby, K. M. (1972) Dislocation Interactions with Thermal Phonons and Conduction Electrons
• Nagata, Norio and Vreeland, T., Jr. (1970) Mobility of Basal Dislocations Interacting with Non Basal Dislocations in Zinc; 10.2172/4114816
• Jassby, K. M. and Vreeland, T., Jr. (1969) On the Damping of Screw Dislocation Motion in FCC Crystals by Phonon Viscosity
• Pope, D. P. and Vreeland, T., Jr. (1969) Mobility of Basal Dislocations in Zinc
• Jassby, K. M. and Vreeland, T., Jr. (1969) The Mobility of Edge Dislocations in Pure Copper Single Crystals
• Vreeland, T., Jr. (1967) Dislocation Velocity Measurements in Copper and Zinc
• Pope, D. P. and Vreeland, T., Jr., el al. (1967) A Comparison System for Microscope Images
• Blish, R. C., II and Vreeland, T., Jr. (1967) Dislocation Velocity on the {1212}〈1213〉Slip System of Zinc
• Adams, K. H. and Blish, R. C., el al. (1966) Second Order Pyramidal Slip in Zinc
• Moon, D. W. and Vreeland, T., Jr. (1963) Dislocation Velocity in Single and Polycrystalline Silicon Iron
• Adams, K. H. and Vreeland, T., Jr. (1963) Crystallographic Dependence of a Dislocation Etch for Zinc Single Crystals
• Vreeland, T., Jr. and Wood, D. S. (1954) A Comparison Between Dislocation Theory and Experimental Measurements of Delayed Yield in Steel
• Vreeland, T., Jr. and Wood, D. S., el al. (1952) A study of the mechanism of the delayed yield phenomenon