<h1>Royea, William Joseph</h1>
<h2>Combined from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Anz, Samir J. and Fajardo, Arnel M., el al. (2012) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20130205-105735010">Semiconductor photoelectrochemistry</a>; ISBN 978-1-1181-1074-4; Characterization of Materials; 864-898; <a href="https://doi.org/10.1002/0471266965.com052.pub2">10.1002/0471266965.com052.pub2</a></li>
<li>Royea, William J. and Hamann, Thomas W., el al. (2006) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20170524-100829690">A Comparison between Interfacial Electron-Transfer Rate Constants at Metallic and Graphite Electrodes</a>; Journal of Physical Chemistry B; Vol. 110; No. 39; 19433-19442; <a href="https://doi.org/10.1021/jp062141e">10.1021/jp062141e</a></li>
<li>Anz, Samir J. and Fajardo, Arnel M., el al. (2002) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20180413-100118785">Semiconductor Photoelectrochemistry</a>; ISBN 9780471268826; Characterization of Materials; <a href="https://doi.org/10.1002/0471266965.com052.pub2">10.1002/0471266965.com052.pub2</a></li>
<li>Gstrein, Florian and Michalak, David J., el al. (2002) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20170519-064910131">Effects of Interfacial Energetics on the Effective Surface Recombination Velocity of Si/Liquid Contacts</a>; Journal of Physical Chemistry B; Vol. 106; No. 11; 2950-2961; <a href="https://doi.org/10.1021/jp012997d">10.1021/jp012997d</a></li>
<li>Royea, William J. and Juang, Agnes, el al. (2000) <a href="https://resolver.caltech.edu/CaltechAUTHORS:ROYapl00">Preparation of air-stable, low recombination velocity Si(111) surfaces through alkyl termination</a>; Applied Physics Letters; Vol. 77; No. 13; 1988-1990; <a href="https://doi.org/10.1063/1.1312203">10.1063/1.1312203</a></li>
</ul>