<h1>Nicolet, Marc-Aurele</h1> <h2>Monograph from <a href="https://data.caltech.edu">CaltechTHESIS advisor</a></h2> <ul> <li>Sun, Xin (1997) <a href="https://resolver.caltech.edu/CaltechTHESIS:10072014-112733274">I. Reactively sputtered Ti-Si-N thin films for diffusion barrier applications. II. Oxidation, diffusion and crystallization of an amorphous Zr_(60)Al_(15)Ni_(25) alloy.</a>; <a href="https://doi.org/10.7907/849b-sh13">10.7907/849b-sh13</a></li> <li>Lie, Yu-Chun Donald (1996) <a href="https://resolver.caltech.edu/CaltechETD:etd-12192007-083658">Ion implantation in epitaxial GexSi1-x on Si(100)</a>; <a href="https://doi.org/10.7907/6GA1-F433">10.7907/6GA1-F433</a></li> <li>Reid, Jason S. (1995) <a href="https://resolver.caltech.edu/CaltechETD:etd-10192007-131842">Amorphous ternary diffusion barriers for silicon metallizations</a>; <a href="https://doi.org/10.7907/4TFH-VM05">10.7907/4TFH-VM05</a></li> <li>Chen, Jen-Sue (1995) <a href="https://resolver.caltech.edu/CaltechETD:etd-09172007-133201">Ohmic contacts to beta silicon carbide : electrical and metallurgical characterizations</a>; <a href="https://doi.org/10.7907/yk40-pj23">10.7907/yk40-pj23</a></li> <li>Liu, Wen-Shu (1994) <a href="https://resolver.caltech.edu/CaltechETD:etd-11302007-084825">Oxidation of GeSi and applications</a>; <a href="https://doi.org/10.7907/pv5t-qy03">10.7907/pv5t-qy03</a></li> <li>Workman, Thomas Wilson (1992) <a href="https://resolver.caltech.edu/CaltechETD:etd-08172007-080314">Analysis of collision cascades in titanium deuteride by D-D fusion</a>; <a href="https://doi.org/10.7907/fa6m-mh68">10.7907/fa6m-mh68</a></li> <li>Bai, Gang (1991) <a href="https://resolver.caltech.edu/CaltechETD:etd-06282007-105319">I. Heteroepitaxy on Si. II. Ion implantation in Si and heterostructures</a>; <a href="https://doi.org/10.7907/v8kr-gm23">10.7907/v8kr-gm23</a></li> <li>Kim, Sung Joon (1988) <a href="https://resolver.caltech.edu/CaltechETD:etd-11062007-081348">I. Ion-Solid Interactions with Markers. II. Oxidation Phenomena in Silicides and Aluminides</a>; <a href="https://doi.org/10.7907/av5j-xe20">10.7907/av5j-xe20</a></li> <li>So, Frank Cheung Tao (1988) <a href="https://resolver.caltech.edu/CaltechETD:etd-02012007-110846">Diffusion Barriers for VLSI Applications</a>; <a href="https://doi.org/10.7907/7ytp-0932">10.7907/7ytp-0932</a></li> <li>Banwell, Thomas Clyde (1986) <a href="https://resolver.caltech.edu/CaltechETD:etd-03242008-133647">Investigations of Atomic Transport Induced by Heavy Ion Irradiation</a>; <a href="https://doi.org/10.7907/3sgh-2m46">10.7907/3sgh-2m46</a></li> <li>Liew, Boon-Khim (1985) <a href="https://resolver.caltech.edu/CaltechTHESIS:10152014-085619478">Study of Solid-Phase Reactions of metals on GaAs</a>; <a href="https://doi.org/10.7907/pay8-6h38">10.7907/pay8-6h38</a></li> <li>Lien, Chuen-Der (1985) <a href="https://resolver.caltech.edu/CaltechETD:etd-03272008-074200">Thin Film Silicide Formation by Thermal Annealing: Study of Kinetics, Moving Species, Impurity Effect, and Electrical Properties</a>; <a href="https://doi.org/10.7907/t5r5-5267">10.7907/t5r5-5267</a></li> <li>Bartur, Meir (1984) <a href="https://resolver.caltech.edu/CaltechETD:etd-11032005-130746">Utilization of Silicides for VLSI-Contacts with Aluminum and Thermal Oxidation</a>; <a href="https://doi.org/10.7907/V36Y-BW59">10.7907/V36Y-BW59</a></li> <li>Ho, Kuo Ting (1984) <a href="https://resolver.caltech.edu/CaltechETD:etd-11072005-080724">Evolution of Nitrogen Impurities in Metal-Silicon Binary Couples and their Effect on Silicide Formation</a>; <a href="https://doi.org/10.7907/tz19-ww79">10.7907/tz19-ww79</a></li> <li>Scott, David Martin (1982) <a href="https://resolver.caltech.edu/CaltechETD:etd-09062006-140245">The Effects of Oxygen on the Formation of Ni, Pd, and Pt Silicides</a>; <a href="https://doi.org/10.7907/234h-2915">10.7907/234h-2915</a></li> <li>Tsaur, Bor-Yeu (1980) <a href="https://resolver.caltech.edu/CaltechETD:etd-10102006-094500">Ion-Beam-Induced Modifications of Thin Film Structures and Formation of Metastable Phases</a>; <a href="https://doi.org/10.7907/2v82-tm86">10.7907/2v82-tm86</a></li> <li>Cheung, Woontong Nathan (1980) <a href="https://resolver.caltech.edu/CaltechETD:etd-10122006-090333">I. Channeling Studies of Silicon Interfaces. II. Diffusion Barrier Properties of Titanium Nitride</a>; <a href="https://doi.org/10.7907/e47n-cg57">10.7907/e47n-cg57</a></li> <li>Harris, Joe Marion, Jr. (1976) <a href="https://resolver.caltech.edu/CaltechTHESIS:07172014-102340032">Part I. Energy Straggling of ⁴He below 2.0 MeV in Al, Ni, Au, and Pt. Part II. Studies of the Ti-W Metallization System on Si</a>; <a href="https://doi.org/10.7907/C4FY-ZX66">10.7907/C4FY-ZX66</a></li> <li>Feng, Joseph Shao-Ying (1975) <a href="https://resolver.caltech.edu/CaltechTHESIS:04062012-150944579">I. Stopping Cross Section Additivity for 0-2 MeV ⁴He Ions in Solids. II. Magnetite Thin Films: Fabrication and Electrical Properties</a>; <a href="https://doi.org/10.7907/1C3P-AH34">10.7907/1C3P-AH34</a></li> <li>Bower, Robert William (1973) <a href="https://resolver.caltech.edu/CaltechETD:etd-04122004-132122">Reaction Kinetics of Pd and Ti-Al Films on Si</a>; <a href="https://doi.org/10.7907/NY05-4E97">10.7907/NY05-4E97</a></li> <li>Vu, Quat Thuong (1970) <a href="https://resolver.caltech.edu/CaltechTHESIS:10062014-162429098">Space-Charge-Limited Current in Fast Neutron Irradiated Silicon</a>; <a href="https://doi.org/10.7907/T93C-DG21">10.7907/T93C-DG21</a></li> <li>Rodriguez, Valentin (1969) <a href="https://resolver.caltech.edu/CaltechETD:etd-09272002-164439">Measurement of the Electron Drift Velocity in Silicon</a>; <a href="https://doi.org/10.7907/B8ER-9195">10.7907/B8ER-9195</a></li> <li>Lee, Don Howard (1969) <a href="https://resolver.caltech.edu/CaltechTHESIS:10072014-144607202">Double-Injection: High Frequency Noise and Temperature Dependence</a>; <a href="https://doi.org/10.7907/964x-ab98">10.7907/964x-ab98</a></li> <li>Shumka, Alex (1964) <a href="https://resolver.caltech.edu/CaltechETD:etd-10082002-102055">Space-Charge-Limited Current in Germanium</a>; <a href="https://doi.org/10.7907/EV7W-8D66">10.7907/EV7W-8D66</a></li> </ul>