Nicolet, Marc-Aurele
- Eisen, F. H. and Nicolet, M.-A. (2003) Preferred Position of the Detector for MeV Backscattering Spectrometry; ISBN 0-7354-0149-7; Application of accelerators in research and industry; 411-413; 10.1063/1.1619747
- Gasser, S. M. and Bachli, A., et el. (1998) Reaction sequence of thin Ni films with (001) 3C-SiC; 10.1109/MAM.1998.887570
- Vreeland, T., Jr. and Dommann, A., et el. (1988) X-Ray Diffraction Determination of Stresses in Thin Films; ISBN 9781558990036; Thin films: Stresses and Mechanical Properties; 3-12; 10.1557/PROC-130-3
- Bai, Gang and Nicolet, Marc-A., et el. (1988) Thermal Strain Measurements in Epitaxial CoSi_2/Si by Double Crystal X-Ray Diffraction; ISBN 9781558990036; Thin films: stresses and mechanical properties; 35-40; 10.1557/PROC-130-35
- Bai, G. and Jamieson, D. N., et el. (1987) Defects Annealing of Si^+ Implanted GaAs at RT and 100°C; ISBN 9780931837609; Materials Modification and Growth Using Ion Beams; 67-72; 10.1557/PROC-93-67
- Bai, Gang and Jamieson, David N., et el. (1987) Misoriented Epitaxial Growth of (111)CoSi_2 on Offset (111)Si Substrates; ISBN 9780931837708; Epitaxy of Semiconductor Layered Structures; 259-264; 10.1557/PROC-102-259
- Hamdi, A. H. and Tandon, J. L., et el. (1984) Strain and Damage Measurements in Ion Implanted Al_xGa_(1−x)As/GaAs Superlattices; ISBN 9780931837029; Layered structures, epitaxy, and interfaces; 319-325; 10.1557/PROC-37-319
- Scherzer, B. M. U. and Børgesen, P., et el. (1976) Determination of Stopping Cross Sections by Rutherford Backscattering; ISBN 978-1-4615-8878-8; Ion Beam Surface Layer Analysis; 33-46; 10.1007/978-1-4615-8876-4_4