<h1>Midzor, Melissa Masae</h1>
<h2>Combined from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Hammel, P. Chris and Pelekhov, Denis V., el al. (2003) <a href="https://resolver.caltech.edu/CaltechAUTHORS:HAMprocieee03">The magnetic-resonance force microscope: a new tool for high-resolution, 3-D, subsurface scanned probe imaging</a>; Proceedings of the IEEE; Vol. 91; No. 5; 789-798; <a href="https://doi.org/10.1109/JPROC.2003.811797">10.1109/JPROC.2003.811797</a></li>
<li>Midzor, M. M. and Wigen, P. E., el al. (2000) <a href="https://resolver.caltech.edu/CaltechAUTHORS:MIDjap00">Imaging mechanisms of force detected FMR microscopy</a>; Journal of Applied Physics; Vol. 87; No. 9; 6493-6495; <a href="https://doi.org/10.1063/1.372748">10.1063/1.372748</a></li>
<li>Zhang, Z. and Hammel, P. C., el al. (1998) <a href="https://resolver.caltech.edu/CaltechAUTHORS:ZHAapl98">Ferromagnetic resonance force microscopy on microscopic cobalt single layer films</a>; Applied Physics Letters; Vol. 73; No. 14; 2036-2038; <a href="https://doi.org/10.1063/1.122359">10.1063/1.122359</a></li>
<li>Suh, B. J. and Hammel, P. C., el al. (1998) <a href="https://resolver.caltech.edu/CaltechAUTHORS:SUHjvstb98">Ferromagnetic resonance imaging of Co films using magnetic resonance force microscopy</a>; Journal of Vacuum Science and Technology B; Vol. 16; No. 4; 2275-2279; <a href="https://doi.org/10.1116/1.590161">10.1116/1.590161</a></li>
</ul>