Mayer, James W.

Book Chapter from CaltechAUTHORS

• Scherzer, B. M. U. and Børgesen, P., et el. (1976) Determination of Stopping Cross Sections by Rutherford Backscattering; ISBN 978-1-4615-8878-8; Ion Beam Surface Layer Analysis; 33-46; 10.1007/978-1-4615-8876-4_4
• Gamo, K. and Inada, T., et el. (1976) Analysis of Ga_(1-x)Al_xAs-GaAs Heteroepitaxial Layers by Proton Backscattering; ISBN 978-1-4615-8878-8; Ion Beam Surface Layer Analysis; 375-384; 10.1007/978-1-4615-8876-4_32
• Mayer, J. W. (1973) Ion implantation in semiconductors; 10.1109/IEDM.1973.188633