<h1>Mayer, James W.</h1>
<h2>Book Chapter from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Scherzer, B. M. U. and Børgesen, P., el al. (1976) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20180830-103505467">Determination of Stopping Cross Sections by Rutherford Backscattering</a>; ISBN 978-1-4615-8878-8; Ion Beam Surface Layer Analysis; 33-46; <a href="https://doi.org/10.1007/978-1-4615-8876-4_4">10.1007/978-1-4615-8876-4_4</a></li>
<li>Gamo, K. and Inada, T., el al. (1976) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20180830-102916110">Analysis of Ga_(1-x)Al_xAs-GaAs Heteroepitaxial Layers by Proton Backscattering</a>; ISBN 978-1-4615-8878-8; Ion Beam Surface Layer Analysis; 375-384; <a href="https://doi.org/10.1007/978-1-4615-8876-4_32">10.1007/978-1-4615-8876-4_32</a></li>
<li>Mayer, J. W. (1973) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20170809-160158554">Ion implantation in semiconductors</a>; <a href="https://doi.org/10.1109/IEDM.1973.188633">10.1109/IEDM.1973.188633</a></li>
</ul>