@inbook{https://resolver.caltech.edu/CaltechAUTHORS:20210127-142447762,
    title = "Electronic Structure of Metal-Semiconductor Contacts",
    chapter = "Fundamental transition in the electronic nature of solids",
    url = "https://resolver.caltech.edu/CaltechAUTHORS:20210127-142447762",
    id = "record",
    isbn = "978-94-010-6780-5",
    doi = "10.1007/978-94-009-0657-0\_10"
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    title = "Optical Reflection Studies of Damage in Ion Implanted Silicon",
    journal = "Journal of Applied Physics",
    url = "https://resolver.caltech.edu/CaltechAUTHORS:MCGjap70a",
    id = "record",
    issn = "0021-8979",
    doi = "10.1103/PhysRevB.11.5208",
    volume = "41"
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@article{https://resolver.caltech.edu/CaltechAUTHORS:KURprl69,
    title = "Fundamental transition in the electronic nature of solids",
    journal = "Physical Review Letters",
    url = "https://resolver.caltech.edu/CaltechAUTHORS:KURprl69",
    id = "record",
    issn = "0031-9007",
    doi = "10.1103/PhysRevLett.22.1433",
    volume = "22"
}


@article{https://resolver.caltech.edu/CaltechAUTHORS:KURapl69,
    title = "Ion implantation damage of silicon as observed by optical reflection spectroscopy in the 1 to 6 eV region",
    journal = "Applied Physics Letters",
    url = "https://resolver.caltech.edu/CaltechAUTHORS:KURapl69",
    id = "record",
    issn = "0003-6951",
    doi = "10.1063/1.1652788",
    volume = "14"
}