<h1>Iannelli, John M.</h1>
<h2>Book Chapter from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Iannelli, John and Blauvelt, Hank, el al. (1999) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20120111-074831719">Determination of dispersion induced relative intensity noise through spectral linewidth measurements</a>; ISBN 0-7803-5633-0; Nanostructures and quantum dots: 1999 IEEE/LEOS summer topical meeting; 9-10; <a href="https://doi.org/10.1109/LEOSST.1999.794728">10.1109/LEOSST.1999.794728</a></li>
</ul>