<h1>Hamill, Gregory P.</h1>
<h2>Article from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Hamill, G. P. and Vreeland, T., Jr. (1979) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20150305-074514002">Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography</a>; Journal of Applied Crystallography; Vol. 12; No. 4; 346-350; <a href="https://doi.org/10.1107/S0021889879012668">10.1107/S0021889879012668</a></li>
<li>Hamill, G. P. and Vreeland, T., Jr. (1978) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20150123-150753843">Silicon strain gages for cryostatic temperature use</a>; Materials Science and Engineering; Vol. 32; No. 1; 99; <a href="https://doi.org/10.1016/0025-5416(78)90216-1">10.1016/0025-5416(78)90216-1</a></li>
</ul>