Griffith, Joseph Edward
- Qiu, Yuanxun and Griffith, J. E., et el. (1984) A new technique for measuring sputtering yields at high energies; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 1; No. 1; 118-122; 10.1016/0168-583X(84)90483-X
- Meins, C. K. and Griffith, J. E., et el. (1983) Sputtering of UF_4 by high energy heavy ions; Radiation Effects; Vol. 71; No. 1-2; 13-33; 10.1080/00337578308218600
- Qiu, Yuanxun and Griffith, J. E., et el. (1983) Sputtering of silicon and its compounds in the electronic stopping region; Radiation Effects and Defects in Solids; Vol. 70; No. 1-4; 231-236; 10.1080/00337578308219218
- Griffith, J. E. and Qiu, Yuanxum, et el. (1982) Ion-beam-enhanced adhesion in the electronic stopping region; Nuclear Instruments and Methods; Vol. 198; No. 2-3; 607-609; 10.1016/0167-5087(82)90308-8
- Seiberling, L. E. and Meins, C. K., et el. (1982) The sputtering of insulating materials by fast heavy ions; Nuclear Instruments and Methods in Physics Research; Vol. 198; No. 1; 17-26; 10.1016/0167-5087(82)90045-X
- Qiu, Yuanxun and Griffith, J. E., et el. (1982) Sputtering of Al_2O_3 and LiNbO_3 in the electronic stopping region; Radiation Effects and Defects in Solids; Vol. 64; No. 1-4; 111-116; 10.1080/00337578208223000
- Seiberling, L. E. and Griffith, J. E., et el. (1980) A thermalized ion explosion model for high energy sputtering and track resignation; Radiation Effects; Vol. 52; No. 3-4; 201-210; 10.1080/00337578008210033
- Libbrecht, K. G. and Griffith, J. E., et el. (1980) Energy dependence of the trapping of uranium atoms by aluminum oxide surfaces; Radiation Effects and Defects in Solids; Vol. 49; No. 4; 195-201; 10.1080/00337578008237483
- Griffith, J. E. and Weller, R. A., et el. (1980) Sputtering of uranium tetrafluoride in the electronic stopping region; Radiation Effects; Vol. 51; No. 3-4; 223-232; 10.1080/00337578008210004
- Griffith, J. E. and Haff, P. K., et el. (1974) Energy Levels of Highly Excited Muonic Atoms; Annals of Physics; Vol. 87; No. 1; 1-16; 10.1016/0003-4916(74)90444-8