[ { "id": "authors:zxv32-pad14", "collection": "authors", "collection_id": "zxv32-pad14", "cite_using_url": "https://resolver.caltech.edu/CaltechAUTHORS:20190207-125601247", "type": "book", "title": "Phase Transitions in Materials: Advanced Topics", "author": [ { "family_name": "Fultz", "given_name": "Brent", "orcid": "0000-0002-6364-8782", "clpid": "Fultz-B" } ], "abstract": "This book explains the thermodynamics and kinetics of most of the important phase transitions in materials science. It is a textbook, so the emphasis is on explanations of phenomena rather than a scholarly assessment of their origins. The goal is explanations that are concise, clear, and reasonably complete. The level and detail are appropriate for upper division undergraduate students and graduate students in materials science and materials physics. The book should also be useful for researchers who are not specialists in these fields. The book is organized for approximately linear coverage in a graduate-level course. The four parts of the book serve different purposes, however, and should be approached differently.", "doi": "10.7907/05by-qx43", "isbn": "9781600490101", "publisher": "California Institute of Technology", "place_of_publication": "Pasadena, CA", "publication_date": "2020-04" }, { "id": "authors:3xm22-rgm85", "collection": "authors", "collection_id": "3xm22-rgm85", "cite_using_url": "https://authors.library.caltech.edu/records/3xm22-rgm85", "type": "book", "title": "Phase Transitions in Materials", "author": [ { "family_name": "Fultz", "given_name": "Brent T.", "orcid": "0000-0002-6364-8782", "clpid": "Fultz-B" } ], "abstract": "

The new edition of this popular textbook provides a fundamental approach to phase transformations and thermodynamics of materials. Explanations are emphasised at the level of atoms and electrons, and it comprehensively covers the classical topics from classical metallurgy to nanoscience and magnetic phase transitions. The book has three parts, covering the fundamentals of phase transformations, the origins of the Gibbs free energy, and the major phase transformations in materials science. A fourth part on advanced topics is available online. Much of the content from the first edition has been expanded, notably precipitation transformations in solids, heterogeneous nucleation, and energy, entropy and pressure. Three new chapters have been added to cover interactions within microstructures, surfaces, and solidification. Containing over 170 end-of-chapter problems, it is a valuable companion for graduate students and researchers in materials science, engineering, and applied physics.

", "doi": "10.1017/9781108641449", "isbn": "9781108641449", "publisher": "Cambridge University Press", "place_of_publication": "New York, NY", "publication_date": "2020-04", "edition": "2", "pages": "xix, 587 p." }, { "id": "authors:mv62t-feb47", "collection": "authors", "collection_id": "mv62t-feb47", "cite_using_url": "https://resolver.caltech.edu/CaltechAUTHORS:20190130-112936843", "type": "book", "title": "Phase Transitions in Materials", "author": [ { "family_name": "Fultz", "given_name": "Brent", "orcid": "0000-0002-6364-8782", "clpid": "Fultz-B" } ], "abstract": "This book explains the thermodynamics and kinetics of most of the important phase transitions in materials science. It is a textbook, so the emphasis is on explanations of phenomena rather than a scholarly assessment of their origins. The goal is explanations that are concise, clear, and reasonably complete. The level and detail are appropriate for upper division undergraduate students and graduate students in materials science and materials physics. The book should also be useful for researchers who are not specialists in these fields. The book is organized for approximately linear coverage in a graduate-level course. The four parts of the book serve different purposes, however, and should be approached differently.", "doi": "10.1017/cbo9781107589865", "isbn": "9781107589865", "publisher": "Cambridge University Press", "place_of_publication": "Cambridge", "publication_date": "2014-09" }, { "id": "authors:np19b-7wy86", "collection": "authors", "collection_id": "np19b-7wy86", "cite_using_url": "https://resolver.caltech.edu/CaltechAUTHORS:20200203-133756433", "type": "book", "title": "Transmission Electron Microscopy and Diffractometry of Materials (Fourth Edition)", "author": [ { "family_name": "Fultz", "given_name": "Brent", "orcid": "0000-0002-6364-8782", "clpid": "Fultz-B" }, { "family_name": "Howe", "given_name": "James", "clpid": "Howe-J-M" } ], "contributor": [ { "family_name": "Fultz", "given_name": "Brent", "clpid": "Fultz-B" }, { "family_name": "Howe", "given_name": "James", "clpid": "Howe-J-M" } ], "abstract": "This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.", "doi": "10.1007/978-3-642-29761-8", "isbn": "978-3-642-29760-1", "publisher": "Springer", "place_of_publication": "Berlin", "publication_date": "2013" }, { "id": "authors:hm95b-bma64", "collection": "authors", "collection_id": "hm95b-bma64", "cite_using_url": "https://resolver.caltech.edu/CaltechAUTHORS:20121025-210157406", "type": "book", "title": "Transmission Electron Microscopy and Diffractometry of Materials (Third Edition)", "author": [ { "family_name": "Fultz", "given_name": "Brent", "orcid": "0000-0002-6364-8782", "clpid": "Fultz-B" }, { "family_name": "Howe", "given_name": "James M.", "clpid": "Howe-J-M" } ], "abstract": "This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.", "isbn": "978-3-540-73885-5", "publisher": "Springer", "place_of_publication": "Heidelberg", "publication_date": "2007" }, { "id": "authors:m81yd-agj28", "collection": "authors", "collection_id": "m81yd-agj28", "cite_using_url": "https://resolver.caltech.edu/CaltechAUTHORS:20200811-143757086", "type": "book", "title": "Transmission Electron Microscopy and Diffractometry of Materials", "book_title": "Transmission Electron Microscopy and Diffractometry of Materials", "author": [ { "family_name": "Fultz", "given_name": "Brent", "orcid": "0000-0002-6364-8782", "clpid": "Fultz-B" }, { "family_name": "Howe", "given_name": "James M.", "clpid": "Howe-J-M" } ], "contributor": [ { "family_name": "Fultz", "given_name": "B.", "clpid": "Fultz-B" }, { "family_name": "Howe", "given_name": "James M.", "clpid": "Howe-J-M" } ], "abstract": "This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.", "doi": "10.1007/978-3-662-04901-3", "isbn": "978-3-662-04903-7", "publisher": "Springer", "place_of_publication": "Berlin", "publication_date": "2002" } ]