<h1>Chasiotis, Ioannis</h1>
<h2>Combined from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Chasiotis, Ioannis and Knauss, Wolfgang G. (2003) <a href="https://resolver.caltech.edu/CaltechAUTHORS:CHAjmps03b">The mechanical strength of polysilicon films: Part 2. Size effects associated with elliptical and circular perforations</a>; Journal of the Mechanics and Physics of Solids; Vol. 51; No. 8; 1551-1572; <a href="https://doi.org/10.1016/S0022-5096(03)00050-4">10.1016/S0022-5096(03)00050-4</a></li>
<li>Chasiotis, Ioannis and Knauss, Wolfgang G. (2003) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20191028-152259537">The mechanical strength of polysilicon films: Part 1. The influence of fabrication governed surface conditions</a>; Journal of the Mechanics and Physics of Solids; Vol. 51; No. 8; 1533-1550; <a href="https://doi.org/10.1016/S0022-5096(03)00051-6">10.1016/S0022-5096(03)00051-6</a></li>
<li>Chasiotis, Ioannis and Knauss, Wolfgang G. (2002) <a href="https://resolver.caltech.edu/CaltechAUTHORS:CHAem02">A New Microtensile Tester for the Study of MEMS Materials with the Aid of Atomic Force Microscopy</a>; Experimental Mechanics; Vol. 42; No. 1; 51-57; <a href="https://doi.org/10.1007/BF02411051">10.1007/BF02411051</a></li>
<li>Chasiotis, Ioannis and Knauss, Wolfgang G. (2000) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20181204-132724650">Microtensile tests with the aid of probe microscopy for the study of MEMS materials</a>; ISBN 9780819438317; Materials and Device Characterization in Micromachining III; 96-103; <a href="https://doi.org/10.1117/12.395616">10.1117/12.395616</a></li>
<li>Chasiotis, Ioannis and Knauss, Wolfgang G. (1998) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20180813-091037460">Mechanical properties of thin polysilicon films by means of probe microscopy</a>; ISBN 9780819429711; Materials and Device Characterization in Micromachining; 66-75; <a href="https://doi.org/10.1117/12.324072">10.1117/12.324072</a></li>
</ul>