<h1>Chasiotis, Ioannis</h1>
<h2>Book Chapter from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Chasiotis, Ioannis and Knauss, Wolfgang G. (2000) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20181204-132724650">Microtensile tests with the aid of probe microscopy for the study of MEMS materials</a>; ISBN 9780819438317; Materials and Device Characterization in Micromachining III; 96-103; <a href="https://doi.org/10.1117/12.395616">10.1117/12.395616</a></li>
<li>Chasiotis, Ioannis and Knauss, Wolfgang G. (1998) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20180813-091037460">Mechanical properties of thin polysilicon films by means of probe microscopy</a>; ISBN 9780819429711; Materials and Device Characterization in Micromachining; 66-75; <a href="https://doi.org/10.1117/12.324072">10.1117/12.324072</a></li>
</ul>