[
    {
        "id": "authors:4p9r3-e9q67",
        "collection": "authors",
        "collection_id": "4p9r3-e9q67",
        "cite_using_url": "https://resolver.caltech.edu/CaltechAUTHORS:BOEapl01b",
        "type": "article",
        "title": "Localized charge injection in SiO\u2082 films containing silicon nanocrystals",
        "author": [
            {
                "family_name": "Boer",
                "given_name": "Elizabeth A.",
                "clpid": "Boer-Elizabeth-A"
            },
            {
                "family_name": "Brongersma",
                "given_name": "Mark L.",
                "clpid": "Brongersma-Mark-L"
            },
            {
                "family_name": "Atwater",
                "given_name": "Harry A.",
                "orcid": "0000-0001-9435-0201",
                "clpid": "Atwater-H-A"
            },
            {
                "family_name": "Flagan",
                "given_name": "Richard C.",
                "orcid": "0000-0001-5690-770X",
                "clpid": "Flagan-R-C"
            },
            {
                "family_name": "Bell",
                "given_name": "L. D.",
                "clpid": "Bell-L-D"
            }
        ],
        "abstract": "An atomic-force microscope (AFM) is used to locally inject, detect, and quantify the amount and location of charge in SiO\u2082 films containing Si nanocrystals (size ~2\u20136 nm). By comparison with control samples, charge trapping is shown to be due to nanocrystals and not ion-implantation-induced defects in samples containing ion-beam-synthesized Si nanocrystals. Using an electrostatic model and AFM images of charge we have estimated the amount of charge injected in a typical experiment to be a few hundred electrons and the discharge rate to be ~35 \u00b1 15 e/min.",
        "doi": "10.1063/1.1383574",
        "issn": "0003-6951",
        "publisher": "American Institute of Physics",
        "publication": "Applied Physics Letters",
        "publication_date": "2001-08-06",
        "series_number": "6",
        "volume": "79",
        "issue": "6",
        "pages": "791-793"
    }
]