<h1>Ahn, Channing</h1>
<h2>Book Chapter from <a href="https://authors.library.caltech.edu">CaltechAUTHORS</a></h2>
<ul>
<li>Graetz, J. and Yazami, R., el al. (2002) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20200221-100449979">Electronic Structure of Oxygen in Delitiated LiTMO₂ Studied by Electron Energy-Loss Spectrometry</a>; ISBN 978-1-4020-0595-4; New Trends in Intercalation Compounds for Energy Storage; 469-474; <a href="https://doi.org/10.1007/978-94-010-0389-6_32">10.1007/978-94-010-0389-6_32</a></li>
<li>Nieh, C. W. and Xiong, F., el al. (1988) <a href="https://resolver.caltech.edu/CaltechAUTHORS:20150211-120450224">Formation of Buried Oxide in MeV Oxygen Implanted Silicon</a>; ISBN 9780931837753; Silicon-on-Insulator and Buried Metals in Semiconductors; 73-78; <a href="https://doi.org/10.1557/PROC-107-73">10.1557/PROC-107-73</a></li>
</ul>